Interaction between electronic structure and strain in Bi nanolines on Si ( 001 )
نویسندگان
چکیده
Heteroepitaxial strain can be a controlling factor in the lateral dimensions of 1-D nanostructures. Bi nanolines on Si(001) have an atomic structure which involves a large sub-surface reconstruction, resulting in a strong elastic coupling to the surrounding silicon. We present variable-bias STM and first principles electronic structure calculations of the Bi nanolines, which investigates this interaction. We show that the strain associated with the nanolines affects the atomic and electronic structure of at least two neighbouring Si dimers, and identify the mechanism behind this. We also present partial charge densities (projected by energy) for the nanoline with clean and hydrogenated surroundings and contrast it to the clean Si(001) surface.
منابع مشابه
Stress relief as the driving force for self-assembled bi nanolines.
Bi nanolines self-assemble on Si(001) and are remarkable for their straightness and length-they are often more than 400 nm long, and a kink in a nanoline has never been observed. Through electronic structure calculations, we have found an energetically favorable structure for these nanolines that agrees with our scanning tunneling microscopy and photoemission experiments; the structure has an e...
متن کاملReply to comment by D R Bowler et al, Bi nanolines on Si(001): registry with the substrate
The registry of bismuth dimers, integral components of the bismuth nanoline on Si(001), is examined. In contrast to the currently accepted view, the bismuth dimers are found to be in registry with the two-dimensional lattice created by the silicon dimers. The consequences of this finding are briefly explored.
متن کاملOne-dimensional Si-in-Si(001) template for single-atom wire growth
Single atom metallic wires of arbitrary length are of immense technological and scientific interest. We present atomic-resolution scanning tunneling microscope data of a silicon-only template, which modeling predicts to enable the self-organized growth of isolated micrometer long surface and subsurface single-atom chains. It consists of a one-dimensional, defect-free Si reconstruction four dime...
متن کاملEffect of Strain on Structure and Morphology of Ultrathin Ge Films on Si(001).
Conventional surface probes are usually diffraction-based techniques, by which real-space surface structures are indirectly derived from their representations in the reciprocal space. While diffraction probes are very useful in determining the long-range order of a surface, they often suffer from ambiguities in atomic details. The advance of a new generation of surface probes based on force and...
متن کاملX-ray scattering studies of surfactant mediated epitaxial growth of SiÕGeÕSi„001... heterostructures
The strain and morphology of Si/Ge films grown by surfactant mediated molecular beam epitaxy on Si~001! with Bi as the surfactant were studied with grazing-incidence x-ray diffraction, x-ray reflectivity, low-energy electron diffraction, and Auger electron spectroscopy. Bi is observed to prevent the intermixing of Ge and Si layers by inhibiting Ge segregation in Si. Without a surfactant the cri...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2002